A study was undertaken to investigate the sputtered efflux from 5-, 8-, and 30-cm diameter mercury ion thrusters. Quartz crystal microbalances and fused silica samples were used to analyze the sputtered flux. Spectral transmittance measurements and spectrographic analysis of the samples were made after they were exposed to different thruster effluence by operating the thrusters at various conditions and durations of time. These measurements were used to locate the source of the efflux and determine its accumulated effect at various locations near the thruster. Comparisons of in situ and ex situ transmittance measurements of samples exposed to thruster efflux are also presented.